Course title | |||||
電気電子工学特別講義(計測工学特別講義) [Advanced Lectures on Electrical and Electronics Engineering] | |||||
Course category | technology speciality courses,ets. | Requirement | Credit | 2 | |
Department | Year | 3~4 | Semester | Spring | |
Course type | Spring | Course code | 025708 | ||
Instructor(s) | |||||
羽持 満, 涌井 伸二 [HAMOCHI Mitsuru, WAKUI Shinji] | |||||
Facility affiliation | Graduate School of Engineering | Office | Email address |
Course description |
This 2-credit course provides students with the foundation for the electron microscope. Especially, countermeasures against nanometer order vibration are shown. |
Expected Learning |
Through investigations which are carried out at the industrial field, lecturer hopes that these knowledge help students for future. |
Course schedule |
Episode 1: Summary of electron microscope Episode 2: Disturbance elements which influence on performances Episode 3: Vibration theory and Fourier analysis Episode 4: Magnetic shielding effect Episode 5: Modeling using one degree-of-freedom Episode 6: Review. Measures of vibration against common machine. Episode 7: Modal analysis and mode shaping Episode 8: Rolling guide element and its spring feature in micro-displacement Episode 9: Problems of active control and beam deflection compensator Episode 10: Special nature of micro-vibration Episode 11: Review. Wide range dynamic vibration absorber Episode 12: Sub-angstrom measures of specimen holder Episode 13: ODS analysis and suppression of transmitted floor vibration Episode 14: Design of electron microscope considering stiffness from the view point of electron optics # Final examination |
Prerequisites |
Required Text(s) and Materials |
Created document |
References |
Assessment/Grading |
Final examination and attendance percentage with test |
Message from instructor(s) |
Course keywords |
Electron microscope, Nanometer, Micro vibration, Modal analysis |
Office hours |
Remarks 1 |
Remarks 2 |
Related URL |
Lecture Language |
Language Subject |
Last update |
9/4/2017 5:12:10 PM |